SanjSCOPE NT220
Cutting-edge thermal imaging processing technology for semiconductor and device analysis.
The SanjSCOPE NT220 is the flagship thermal reflection imaging system from Microsanj, achieving sub-micron level spatial resolution and nanosecond-scale transient thermal analysis. Designed for semiconductor failure analysis, RF device characterization, and advanced materials research, the NT220 provides unparalleled accuracy and speed in identifying and analyzing thermal behavior at the microscale. Key Features and Benefits: - Ultra-high spatial resolution – Enables detailed thermal mapping down to 250nm. - Nanosecond-scale thermal analysis – Captures fast transient thermal phenomena. - Advanced failure analysis – Detects hotspots, temperature gradients, and device defects. - Non-destructive testing – Ideal for semiconductors, RF, and photonics. - Seamless system integration – Compatible with optical pump-probe techniques and multilayer device testing.
- Company：Antenna Technology Inc.
- Price：Other
